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| SEM AND AFM-COMPLEMENTARY TECHNIQUES FOR SURFACE INVESTIGATION |
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| DOI： |
| KeyWord:SEM,AFM,Surface investigation, |
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| Abstract: |
| For high-resolution surface investigations,two commonly used techniques are Scanning Electron Microscopy(SEM)and Atomic Force Microscopy(AFM).Especially for the resolution in nanometer and angstrom ranges,both SEM and AFM are the most powerful microscopy technique available today.However,no one instrument is all-round.In this paper,these two techniques are compared with respect to the surface structure and composition of materials and environment,which demonstrate how these analytical techniques provide the information being complementary in nature. |
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