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| Determination of silicon in copper by Microwave Plasma Atomic Emission Spectrometry |
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Received:August 22, 2013
Revised:November 11, 2013
Accepted:August 23, 2013
Published Online:December 21, 2013
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| DOI： |
| KeyWord:MP-AES; copper; silicon e; determination |
| Author | Institution |
| FENG Xianjin |
Beijing General Research Institute of Mining and Metallurgy |
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| Abstract: |
| A method for Determination of silicon in copper metal by Microwave Plasma Atomic emission spectroscopy (MP-AES) was established in this article. The sample was dissolved with nitric acid by heating at low temperature. The spectral line of Si 251.611 nm was selected as analytical line. The matrix of copper did not effect on the determination of silicon by selecting method. The relative standard deviation of silicon in the sample of A-class copper is about 10%, standard addition recovery is between 94% and 105%. The determination results are consistent with determination results by national standards method. The established method is suitable for determination of silicon in copper metal. |
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