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| Analysis of ferrosilicon Component Using XRF with Powder Pressured Sample Method |
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Received:November 22, 2013
Revised:November 25, 2013
Accepted:November 26, 2013
Published Online:March 24, 2014
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| DOI： |
| KeyWord:ferrosilicon;XRF; Matrix Correction; Direct Powder Pressured Sample |
| Author | Institution |
| xian yun |
CNMC SHENYANG NONFERROUS METAL RESEARCH INSTITUTES |
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| Abstract: |
| This study developed a new analytical method about detecting the contents of several elements (Si, Mn, P, Cr, Al and Ca) in ferrosilicon. This method employed x-ray fluorescence spectrometry using matrix correction method, and the samples needed be prepared by direct powder compression. The working curve was obtained through ten reference material. The accuracy precision of this curve was detected through self-test and another two reference material. The results showed that this new method was more convenient and accurate than former ferrosilicon analytical methods. |
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