Uncertainty analysis of Vanadium(V) oxide content in denitration catalyst based on inductively coupled plasma atomic emission spectrometry
Received:June 30, 2023   Revised:July 24, 2023   Accepted:August 08, 2023      Published Online:March 24, 2025
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KeyWord:ICP-AES;Denitration catalyst ;Vanadium(V) oxide;Uncertainty
           
AuthorInstitution
WANG Yong National Quality Supervision and Testing Center of Vanadium and Titanium Products,Panxi Institute of Vanadium and Titanium Inspection and Testing Pan Zhihua ;China
SHI Zong-you National Quality Supervision and Testing Center of Vanadium and Titanium Products,Panxi Institute of Vanadium and Titanium Inspection and Testing Pan Zhihua ;China
SHAO Guo-qing National Quality Supervision and Testing Center of Vanadium and Titanium Products,Panxi Institute of Vanadium and Titanium Inspection and Testing Pan Zhihua ;China
LIU Lin National Quality Supervision and Testing Center of Vanadium and Titanium Products,Panxi Institute of Vanadium and Titanium Inspection and Testing Pan Zhihua ;China
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Abstract:
      The uncertainty in the determination of Vanadium(V) oxide in denitration catalyst by inductively coupled plasma atomic emission spectrometry (ICP-AES) was evaluated, the sources of uncertainty in the measurement process were analyzed, and the uncertainty components generated from sample weighing, sample digestion mode, Standard solution preparation, working curve, measurement repeatability, Molar mass, etc. were analyzed and calculated. Finally, the synthetic uncertainty and expanded uncertainty of the calculation method were calculated. According to the evaluation results of each uncertainty component, the maximum uncertainty of the measurement results comes from the uncertainty introduced by the preparation process of Standard solution (about 50%), repeated measurement of samples (18%) and standard curve change (20%), which should be focused on and controlled during the measurement process. When the Vanadium(V) oxide content in the denitration catalyst is 2.00%, the expanded uncertai
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